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1

Frequency dependence of the lifetime of a surface micromachined microengine driving a load

Danelle M Tanner, William M Miller, Ken A Peterson, Michael T Dugger, William P Eaton, Lloyd W Irwin, Donna C Senft, Norman F Smith, Paiboon Tangyunyong, Samuel L Miller

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 1.73 MB

english, 1999

2

TIVA and SEI developments for enhanced front and backside interconnection failure analysis

E.I. Cole Jr., P. Tangyunyong, D.A. Benson, D.L. Barton

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 738 KB

english, 1999

3

Local thermal probing to detect open and shorted IC interconnections

Edward I. Cole Jr., Paiboon Tangyunyong, Daniel L. Barton

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 440 KB

english, 1999

4

Thermal modeling of localized laser heating in multi-level interconnects

Paiboon Tangyunyong

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 722 KB

english, 2003

5

[IEEE 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual - Reno, NV, USA (1998.03.31-1998.04.2)] 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual (Cat No 98CH36173) RELPHY-98 - Backside localization of open and shorted IC interconnections

Cole, E.I. Jr., Tangyunyong, P., Barton, D.L.

Year:

1998

Language:

english

File:

PDF, 1.98 MB

english, 1998

6

[IEEE 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (8-12 July 2002)] Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) - Resistive interconnection localization

Cole, E.I., Tangyunyong, P., Hawkins, C.F., Bruce, M.R., Bruce, V.J., Ring, R.M., Wan-Loong Chong,

Year:

2002

Language:

english

File:

PDF, 1.26 MB

english, 2002

7

Anharmonicity in AgBr EXAFS

D.R. Batchelor, P. Tangyunyong, T.N. Rhodin, Y.T. Tan, K.J. Lushington

Journal:

Solid State Communications

Year:

1995

Language:

english

File:

PDF, 299 KB

english, 1995

8

SEXAFS study of AgBr(111) and (100) surfaces and comparison to theoretical models

P. Tangyunyong, T.N. Rhodin, Y.T. Tan, K.J. Lushington

Journal:

Surface Science Letters

Year:

1991

Language:

english

File:

PDF, 70 KB

english, 1991

9

Fluorescent microthermal imaging — Theory and methodology for achieving high thermal resolution images

D.L. Barton, P. Tangyunyong

Journal:

Microelectronic Engineering

Year:

1996

Language:

english

File:

PDF, 571 KB

english, 1996

10

Bonding, structure and compositional distribution in sheet crystal silver iodobromide (111)

P. Tangyunyong, T.N. Rhodin, Y.T. Tan, K.J. Lushington, S.P. Lovell

Journal:

Applied Surface Science

Year:

1993

Language:

english

File:

PDF, 935 KB

english, 1993

11

Surface structure studies of silver bromide(111) and (320) using fluorescence SEXAFS

P. Tangyunyong, T.N. Rhodin, R. Ozer, D. Batchelor, Y.T. Tan, K.J. Lushington

Journal:

Physica B: Condensed Matter

Year:

1989

Language:

english

File:

PDF, 244 KB

english, 1989

12

Fluorescence SEXAFS study of the bromination of the silver(110) surface

D.R. Batchelor, P. Tangyunyong, R. Ozer, T.N. Rhodin, Y.T. Tan, K.J. Lushington, D.A. King

Journal:

Physica B: Condensed Matter

Year:

1989

Language:

english

File:

PDF, 164 KB

english, 1989

13

Anharmonic corrections in EXAFS from AgBr

D.R. Batchelor, P. Tangyunyong, T.N. Rhodin, Y.T. Tan, K.J. Lushington

Journal:

Physica B: Condensed Matter

Year:

1995

Language:

english

File:

PDF, 119 KB

english, 1995

14

Issues for single-event proton testing of SRAMs

Schwank, J.R., Dodd, P.E., Shaneyfelt, M.R., Feli, J.A., Hash, G.L., Ferlet-Cavrois, V., Paillet, P., Baggio, J., Tangyunyong, P., Blackmore, E.

Journal:

IEEE Transactions on Nuclear Science

Year:

2004

Language:

english

File:

PDF, 594 KB

english, 2004

15

SEXAFS study of AgBr(111) and (100) surfaces and comparison to theoretical models

P. Tangyunyong, T.N. Rhodin, Y.T. Tan, K.J. Lushington

Journal:

Surface Science

Year:

1991

Language:

english

File:

PDF, 1.09 MB

english, 1991

16

[IEEE 2003 IEEE LEOS Annual Meeting Conference Proceedings - Tucson, AZ, USA (27-28 Oct. 2003)] The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. - Optical tools and techniques for failure analysis of modern integrated circuits

Cole, E.I., Bruce, M.R., Barton, D.L., Tangyunyong, P., Bruce, V.J., Hawkins, C.F., Soden, J.M., Henderson, C.L., Ring, R.M., Chong, W.-L., Eppes, D.H., Wilcox, J., Benson, D.A.

Year:

2003

Language:

english

File:

PDF, 168 KB

english, 2003

17

[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Fault localization and failure modes in microsystems-enabled photovoltaic devices

Yang, B. B., Cruz-Campa, J. L., Haase, G. S., Tangyunyong, P., Cole, Edward I., Pimentel, A. A., Resnick, P. J., Okandan, M., Nielson, G. N.

Year:

2013

Language:

english

File:

PDF, 1.42 MB

english, 2013

18

[IEEE 2003 IEEE LEOS Annual Meeting Conference Proceedings - Tucson, AZ, USA (27-28 Oct. 2003)] The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. - Soft defect localization (SDL) in integrated circuits using laser scanning microscopy

Bruce, M.R., Bruce, V.J., Eppes, D.H., Wilcox, J., Cole, E.I., Tangyunyong, P., Hawkins, C.F., Ring, R.

Year:

2003

Language:

english

File:

PDF, 238 KB

english, 2003

19

Nanometer-scale mechanics of gold films

Tangyunyong, P., Thomas, R. C., Houston, J. E., Michalske, T. A., Crooks, R. M., Howard, A. J.

Journal:

Physical Review Letters

Year:

1993

Language:

english

File:

PDF, 921 KB

english, 1993

20

Method for the study of semiconductor device operation using scanning capacitance microscopy

Nakakura, C. Y., Tangyunyong, P., Hetherington, D. L., Shaneyfelt, M. R.

Journal:

Review of Scientific Instruments

Year:

2003

Language:

english

File:

PDF, 698 KB

english, 2003

21

[Int. Test Conference International Test Conference 1997 - Washington, DC, USA (1-6 Nov. 1997)] Proceedings International Test Conference 1997 - Transient power supply voltage (V/sub DDT/) analysis for detecting IC defects

Cole, E.I., Soden, J.M., Tangyunyong, P., Candelaria, P.L., Beegle, R.W., Barton, D.L., Henderson, C.L., Hawkins, C.F.

Year:

1997

Language:

english

File:

PDF, 733 KB

english, 1997

22

Product development and yield enhancement through failure analysis of integrated circuits with scanning capacitance microscopy

Tangyunyong, P., Nakakura, C. Y.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2003

Language:

english

File:

PDF, 912 KB

english, 2003

23

Failure Analysis Techniques for Microsystems-Enabled Photovoltaics

Yang, Benjamin B., Cruz-Campa, Jose L., Haase, Gaddi S., Cole, Edward I., Tangyunyong, Paiboon, Resnick, Paul J., Kilgo, Alice C., Okandan, Murat, Nielson, Gregory N.

Journal:

IEEE Journal of Photovoltaics

Year:

2014

Language:

english

File:

PDF, 709 KB

english, 2014

24

Identification of radiation-induced parasitic leakage paths using light emission microscopy

Shaneyfelt, M.R., Paiboon Tangyunyong,, Hill, T.A., Soden, J.M., Flores, R.S., Schwank, J.R., Dodd, P.E., Hash, G.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2004

Language:

english

File:

PDF, 737 KB

english, 2004

25

[IEEE 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual - Reno, NV, USA (1998.03.31-1998.04.2)] 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual (Cat No 98CH36173) RELPHY-98 - The effect of frequency on the lifetime of a surface micromachined microengine driving a load

Tanner, D.M., Miller, W.M., Eaton, W.P., Irwin, L.W., Peterson, K.A., Dugger, M.T., Senft, D.C., Smith, N.F., Tangyunyong, P., Miller, S.L.

Year:

1998

Language:

english

File:

PDF, 2.75 MB

english, 1998

26

[IEEE 2014 IEEE 40th Photovoltaic Specialists Conference (PVSC) - Denver, CO, USA (2014.6.8-2014.6.13)] 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) - Stress factor assessment for microsystems-enabled photovoltaics

Yang, Benjamin B., Cruz-Campa, Jose L., Haase, Gaddi S., Tangyunyong, Paiboon, Okandan, Murat, Nielson, Gregory N.

Year:

2014

Language:

english

File:

PDF, 772 KB

english, 2014

27

Substrate effects on the nanometer-scale mechanics of gold films

Tangyunyong, P., Thomas, R.C., Houston, J.E., Michalske, T.A., Crooks, R.M., Howard, A.J.

Journal:

Journal of Adhesion Science and Technology

Year:

1994

Language:

english

File:

PDF, 5.23 MB

english, 1994

28

SPIE Proceedings [SPIE Micromachining and Microfabrication - Santa Clara, CA (Monday 18 September 2000)] MEMS Reliability for Critical Applications - Electrostatic discharge/electrical overstress susceptibility in MEMS: a new failure mode

Walraven, Jeremy A., Soden, Jerry M., Tanner, Danelle M., Tangyunyong, Paiboon, Cole, Jr., Edward I., Anderson, Richard E., Irwin, Lloyd W., Lawton, Russell A.

Year:

2000

Language:

english

File:

PDF, 1.80 MB

english, 2000

29

Chemically-sensitive interfacial force microscopy: Contact potential measurements of self-assembling monolayer films

Thomas, R. C., Tangyunyong, P., Houston, J. E., Michalske, T. A., Crooks, R. M.

Journal:

Journal of Physical Chemistry

Year:

1994

Language:

english

File:

PDF, 873 KB

english, 1994

30

Thermal modeling of a polysilicon-metal test structure used for thermally induced voltage alteration characterization

P. Tangyunyong, D. Benson, E. I. Cole

Year:

2000

Language:

english

File:

PDF, 1.13 MB

english, 2000

31

SPIE Proceedings [SPIE Micromachining and Microfabrication - Santa Clara, CA (Sunday 20 September 1998)] Materials and Device Characterization in Micromachining - Failure analysis of surface-micromachined microengines

Peterson, Kenneth A., Tangyunyong, Paiboon, Pimentel, Alejandro A., Friedrich, Craig R., Vladimirsky, Yuli

Year:

1998

Language:

english

File:

PDF, 1.93 MB

english, 1998

32

SPIE Proceedings [SPIE Micromachining and Microfabrication - Santa Clara, CA (Sunday 20 September 1998)] Materials and Device Characterization in Micromachining - Linkage design effect on the reliability of surface-micromachined microengines driving a load

Tanner, Danelle M., Peterson, Kenneth A., Irwin, Lloyd W., Tangyunyong, Paiboon, Miller, William M., Eaton, William P., Smith, Norman F., Rodgers, M. Steven, Friedrich, Craig R., Vladimirsky, Yuli

Year:

1998

Language:

english

File:

PDF, 1.29 MB

english, 1998

33

Characterization of electrically-active defects in ultraviolet light-emitting diodes with laser-based failure analysis techniques

Miller, Mary A., Tangyunyong, Paiboon, Cole, Edward I.

Journal:

Journal of Applied Physics

Year:

2016

Language:

english

File:

PDF, 1.02 MB

english, 2016

34

Diagnosis of Factors Impacting Yield in Multilayer Devices for Superconducting Electronics

Missert, Nancy, Jenkins, Mark W., Tangyunyong, Pai, Mook, William, Vernik, Igor V., Kirichenko, Alex F., Mukhanov, Oleg A., Wynn, Alex, Day, Alexandra L., Bolkhovsky, Vladimir, Johnson, Leonard M.

Journal:

IEEE Transactions on Appiled Superconductivity

Year:

2019

Language:

english

File:

PDF, 2.88 MB

english, 2019

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